[et_pb_section fb_built=”1″ _builder_version=”4.23″ _module_preset=”default” locked=”off” global_colors_info=”{}”][et_pb_row _builder_version=”4.23.1″ _module_preset=”default” custom_margin=”||0px||false|false” custom_padding=”||0px||false|false” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.22.1″ _module_preset=”default” custom_css_main_element=”display:flex;||flex-direction:column;” global_colors_info=”{}”][et_pb_heading title=”Custom Sample Al-Cu-C-Mn-Au-CDMS” _builder_version=”4.27.2″ _module_preset=”default” title_text_color_tablet=”” title_text_color_phone=”” title_text_color_last_edited=”on|desktop” title_letter_spacing_tablet=”” title_letter_spacing_phone=”1px” title_letter_spacing_last_edited=”on|phone” global_colors_info=”{}”][/et_pb_heading][et_pb_text content_tablet=”
5 materials mounted and polished in a standard 12.5 mm aluminum pin stub. In the center of the stub is a 3.05 mm copper 200 µm aperture to serve as Cu/Al reference, as well as a Faraday cup.
- Stainless steel (AISI 316L)
- Silicon dioxide
- Boron
- Carbon
- Manganese
Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, Jeol*, Phenom, Tescan and Zeiss microscopes.
- Product number: 05_EDS_FC
- Price per unit: € 260,-
*Require a pin stub adapter
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5 materials mounted and polished in a standard 12.5 mm aluminum pin stub. In the center of the stub is a 3.05 mm copper 200 µm aperture to serve as Cu/Al reference, as well as a Faraday cup.
- Stainless steel (AISI 316L)
- Silicon dioxide
- Boron
- Carbon
- Manganese
Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, Jeol*, Phenom, Tescan and Zeiss microscopes.
- Product number: 05_EDS_FC
- Price per unit: € 260,-
*Require a pin stub adapter
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This custom sample was made for a customer who is used to execute SEM system maintenance and calibration (EDS and image magnification) on a 1” sample, this ½”sample is a smaller version.
- The Cu aperture is used for EDS calibration (on the edge with the Al).
- The Au and C are used to measure EDS count rate.
- The Mn is used to measure EDS resolution (Mn Kα @5.898keV).
- The CDMS chip is used to check and set the magnification calibration.
The CDMS chip is embedded in the sample so that the surface is just below the Al pin stub surface, this makes it les prone to damage from handling, or even accidental dropping of the sample.
Besides the use for calibration after service or maintenance of the SEM, this can also be used for routinely checking of alignments and calibration.
Customization of sample is not only possible with dedicated elements and compounds, but also with critical dimension standards, Sn balls or other components needed in the sample.
- Product number: CAL_STUB_30
- Price per unit: on request
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